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Electronic Testing

We Offer Electronic Testing Services including:
Testability Analyses - Electrical & MechanicalGenRad Programming - GR227X, GR228X, TS8X

In-System Programming of Devices at In-Circuit Test
for Digital & Hybrid Vector Testing.Fixture-Finishing - GenRad, Teradyne, Adapters, Functional, CustomFunctional Test Systems - utilizing LabVIEW®On-Site Consulting - Supporting Your Tester & ProductsProduct Installation - Including Knowledge Transfer & TrainingContract Test - Testing of Your Products on Our GenRadTest Planning & Re-Engineering - to Enhance Testability & Manufacturability of your product.

Global Semisolutions Electrical Testing Area focuses on developing innovative solutions to our client’s testing needs. We offer a combination of testing experience, technical ability and expertise. Our project managers will work with you to find the best testing solution for your application. An additional benefit to clients is the availability of test reports and data which are updated on-line and can be viewed at your convenience on our secure customer intranet.

Other Capabilities
• EMC
• USCAR
• Relay Testing: Hybrid and Thermal
• Audio Components Testing
• Battery Life Test (CERT)
• Computer Components Testing
• Power Quality/Quantity
• Harmonic Distortion
• Sags/Surges
• Transient Analysis
• Contact Resistance


• Power Studies
• Automotive OEM Specifications
• Simulated Inrush Profiles
• Parametric and Functional Testing
• Flasher/Hazard Testing
• Discrete Component Testing
• Electrical Load-Actual and Simulated
• Fuse Buss
• Road Load Data Acquisition
• Multi-Channel Programmable DC Current
Load Testing

 

JANTX: Military screening level

  1. Parts are received in an ESD bag and inspected
  2. Thermal Shock (Temp Cycle)
    MIL-STD-750 Method -1051
    Condition=C, 10 Cycles
    Temp (EXTREME) 10 min. No dwell at 25 degrees C
    Temperature range= -65 to + 175 degrees C
  3. Thermal Independence
    per applicable device
    MIL-PRF-19500/427K PARA: 4.3.1 & 4.4.1
  4. Hermeticity Testing
    MIL-STD-750 Method - 1071 Cond –H
    Fine Leak
    Max Rate= 5x10-8 atm cc/s
    MIL-STD-750 Method – 1071 Cond –C
    Gross Leak
  5. Initial Electrical Test
    Per device spec
    MIL-PRF-19500/427K
  6. High Temp Reverse Bias
    MIL-STD 750 Method – 1038 Cond: A
    (HTRB)
    Time=48 HRS = +150 degrees C
  7. Interim Burn-In Electrical Test
     Per applicable device
    MIL-PRF -19500/427K
    BF & IR1 for calculations
    @ 25 degrees C ONLY &
    DC on all other parameters
  8. Power Burn-In
    MIL-STD-750 Method – 1038
    (HTRB)          100%
    MIL-PRF-19500/427K PARA: 4.3.2
    Time= 96 HRS= +135 degrees C
  9. Delta Calculations
    IR1 < 100% of initial reading or +- 100 nA dc,
    Whichever is greater
  10. Marking
    On all passing units= GREEN DOT
  11. External Visual
  12. Final Inspections